|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||In Operando Nano- and Micro-mechanical Characterization of Materials with Special Emphasis on In Situ Techniques
||Understanding the Ultra High Strength of Ni Micro-wires from In-situ Deformation Study under X-rays
||Soham Mukherjee, Ludovic Thilly, Celine Gerard, Atul Chokshi, Satyam Suwas
|On-Site Speaker (Planned)
The strength of polycrystalline metals can be affected either by extrinsic or intrinsic size effects: in bulk materials, the strength is independent of the size of the component (no extrinsic size effect), but depends on the internal grain size (intrinsic size effect).
Some recent work on Ni micro-wires has shown remarkable size effects  : the true strength was shown to approach the theoretical strength, though they occur in an unexpected size regime, and on polycrystalline wires.
Our investigations aim at achieving a fundamental understanding of size effect in strengthening observed in polycrystalline micro-wires obtained by conventional drawing, aimed at developing light-weight materials exhibiting ultra-high strength. For this, in- situ deformation tests combined with high energy x-ray diffraction provide original insights to the elementary mechanical response of each of the different grain families occurring within the wires, therefore discriminating the role of grain size with respect to wire size.
||Planned: A print-only volume