About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
|
Symposium
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Purveyors of Processing Science and ICME: A SMD Symposium to Honor the Many Contributions of Taylan Altan, Wei Tsu Wu, Soo-Ik Oh, and Lee Semiatin
|
Presentation Title |
Engineered Residual Stress Optimization and Utilization |
Author(s) |
David U. Furrer, Robert Goetz, Jean Philippe Thomas, Vasisht Venkatesh |
On-Site Speaker (Planned) |
David U. Furrer |
Abstract Scope |
Residual stresses are a complicated feature of nearly all materials and processes. The impact of residual stresses is non-trivial and must be contended with for modern component and system design. Efforts have been conducted by many to develop methods to eliminate or minimize these stresses. Other efforts have aimed to generate residual stresses for local component benefit. As the technology of residual stress measurement has matured, and modeling and simulation capabilities are following, these capabilities are being targeted toward further optimization and utilization of residual stresses for advanced component design. Steps forward are possible, but challenges still remain. Current capabilities of applying engineered residual stresses will be presented along with open issues related to material property understanding, process controls, representation and portability of residual stress data, and overall need for life-cycle digital thread capabilities. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |