|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Phase Stability, Phase Transformations, and Reactive Phase Formation in Electronic Materials XV
||Probing Phase Transformations at the Nanoscales – Synchrotron X-ray Microdiffraction for Advanced Applications in Microelectronics, Phase-Change Memory and Solar PV Devices
||Arief Budiman, Ihor Radchenko, Nobumichi Tamura
|On-Site Speaker (Planned)
Local crystal orientation, lattice distortion and phase transformations can all be probed using submicron size x-ray beam and Laue diffraction. Fast data collection provided by state-of-the-art area detectors at synchrotron facilities and new pattern indexing algorithms optimized for speed make it possible to map large portions of a sample in a reasonable amount of time and get quantitative images of its microstructure in near real time. This technique is particularly suitable for studying the mechanical and microstructural properties of inhomogeneous multi-phase polycrystalline samples. A recent development is Laue diffraction phase mapping which provides quantitative phase distribution in complex crystalline materials. This talk will explore the recent developments in that respect at the Advanced Light Source, illustrated with a few advanced applications in the microelectronics, phase-change memory and solar PV devices/systems.
||Planned: A print-only volume