|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Post Processing Effects on EBSD based Dislocation Density Measurements
||Stuart Wright, David P. Field, Matthew M. Nowell
|On-Site Speaker (Planned)
Electron Backscatter Diffraction (EBSD) has shown great utility in characterizing deformed polycrystals. Local changes in orientation provide evidence of the presence of dislocations in the material. EBSD is capable of capturing these local variations in orientation which can, in turn, be used to calculate the Geometrically Necessary Dislocations (GND) density. However, at smaller spatial scales the local orientation variations become small as well and are often right at the limit of angular precision that can be achieved by EBSD. Various methods have been developed to improve the precision of the orientation measurements. The effect of these data processing methods on the calculation of the GND densities is investigated. In some cases, the reduction of orientation noise via these processing methods improves the GND results; whereas in other cases the processing can lead to misleading results.
||Planned: EPD Congress Volume