|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Characterization of Minerals, Metals, and Materials
||Optical Characterization of α-Ti Grain Orientation: Insight from First-principles Calculations
||Brahim Akdim, Chris Woodward, Micheal Uchic
|On-Site Speaker (Planned)
Ellipsometry is a well-developed characterization method based on the analysis of the polarization of light reflected from the sample. It is a non-destructive technique, with the advantage of imaging large areas in a short time basis. In this work, optical properties of pure alpha-phase titanium in the bulk structure were derived using first-principles calculations. The predicted optical conductivity, obtained within the random phase approximation, demonstrated high anisotropy, discerning the basal plane from the principle axis of the hexagonal lattice. The results were subsequently used to guide the ellipsometry measurements by identifying wavelengths that exhibit the largest anisotropy. In addition, the predicted refractive indices were used, through generalized Fresnel's equations derived for uniaxial crystals, to interpret the observed intensities as a function of the orientation of the principle axis in the grain with respect to the laboratory frame.
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