About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
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Symposium
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Purveyors of Processing Science and ICME: A SMD Symposium to Honor the Many Contributions of Taylan Altan, Wei Tsu Wu, Soo-Ik Oh, and Lee Semiatin
|
Presentation Title |
Towards Rapid Throughout Measurement of Grain Boundary Properties |
Author(s) |
Jin Zhang, Peter W. Voorhees, Henning Poulsen |
On-Site Speaker (Planned) |
Peter W. Voorhees |
Abstract Scope |
The materials design process rests on a foundation of data. Unfortunately, there are many parameters that are central to a design effort and are challenging to measure, such as grain boundary energies and mobilities. A rapid throughput method is developed to measure grain boundary properties by comparing the evolution of experimentally determined 3D grain structures to that derived from phase field simulations. Grain evolution in pure iron is determined in three dimensions and as a function of time using diffraction contrast tomography. Using a time step from these data as an initial condition in a phase-field simulation, the computed grain structure is compared to that measured experimentally at a later time. An optimization technique is then used to find the reduced grain boundary mobilities of many thousands of grains that yields the best match of the simulated microstructure. The results of this approach will be discussed. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |