Abstract Scope |
The physical origin of the orientation relationships (ORs) of thin film grains of an fcc phase on c-sapphire is revisited. Interestingly, they are found to be identical for different phases such as pure Ni, Cu, Al, Pt and CoCrFeNi, while their characteristic parameters (lattice constants, elastic constants, interfacial energies, etc.), which are considered to govern an OR, are different. The role of other parameters such as the interfacial steps are investigated. |