|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Applications of Solidification Fundamentals
||Using Synchrotron X-ray Radiography to Measure the Statistics of Intermetallic Compound (IMC) Selection and Growth during Solidification
||Shikang Feng, Enzo Liotti, Andrew Lui, Sundaram Kumar, Keyna A.Q. O'Reilly, Patrick S. Grant
|On-Site Speaker (Planned)
Synchrotron X-ray radiography and tomography are used increasingly for studying primary phase solidification dynamics. However, in many alloys the primary structure is recrystallized during downstream operations and the secondary intermetallic compounds (IMCs) are controlling the properties of engineering interest, such as toughness. These IMCs are generally anisotropic in morphology and low in volume fraction, making studies of their real-time evolution difficult and obtaining meaningful statistics time-consuming. We present for the first time a technique based on synchrotron X-ray radiography to obtain statistically meaningful data on growth temperature, morphology and velocity of IMCs during directional solidification of model Al-Cu-Fe alloys. The results show robustly effect of Fe concentration, grain refiner and cooling rate on IMC selection, and are validated by post-solidification characterization. The extension of X-ray imaging to other alloys, including multi-component alloys is described, as well as how these insights might be used to develop more tolerant processing approaches.
||Planned: Supplemental Proceedings volume