|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Coherent Imaging
||Revolutions in Coherent X-ray Sources Will Enable Dynamic Nanometer Scale Strain Imaging in Structural Materials
||Richard Sandberg, Saryu Fensin, Ross Harder, John Barber, Richard L Sheffield, Reeju Pokharel, Ricardo Lebensohn, Cris W Barnes
|On-Site Speaker (Planned)
Two revolutionary technologies will continue to change the way we understand how materials are strained, damaged, and eventually fail – brilliant, coherent X-ray sources and coherent diffraction-based imaging techniques. Next generation synchrotrons known as diffraction limited storage rings and hard X-ray free electron lasers will change the available hard X-ray flux by orders of magnitudes and thus enable nanometer scale strain imaging in situ via Bragg coherent diffraction imaging (BCDI). In this talk, we will present our preliminary work on studying nanometer scale strain inside polycrystalline metal films via BCDI and a vision how future facilities will enable massively parallel BCDI on multiple grains simultaneously. This will essentially extend current high energy diffraction microscopy techniques to the nanometer regime and eventually enable imaging of multiple grains under dynamically loaded conditions.
||Planned: Supplemental Proceedings volume