|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Mechanical Behavior at the Nanoscale IV
||Fracture of Cu-Nb Multilayer Films on Polyimide
||Megan Cordill, David R. Economy, Marian S. Kennedy
|On-Site Speaker (Planned)
Nanoscale metallic multilayers on rigid substrates are of interest for their enhanced strength, radiation damage resistance, and wear properties. However, measuring the mechanical behavior of films without the substrate influence can be difficult. One way to evaluate the fracture behavior of multilayer thin films is to deposit the film system onto a polymer substrate and perform tensile straining of the film-substrate system. When tensile straining is performed in-situ with synchrotron radiation or under an optical microscope, the multilayer fracture behavior can be investigated on various levels. Further insight is gained with in-situ X-ray diffraction studies using synchrotron radiation to measure the residual as well as evolving lattice strains of the individual metals in the multilayer. The combined analysis of the in-situ methods provides valuable information on the influence of layer thickness and order of multilayer films, illustrating that the layer order greatly affects the fracture toughness.
||Planned: Supplemental Proceedings volume