| About this Abstract |
| Meeting |
2010 TMS Annual Meeting & Exhibition
|
| Symposium
|
Coatings for Structural, Biological, and Electronic Applications
|
| Presentation Title |
Method of Characterizing Pore Structure in Porous Coating Layer using a Simple Voltammetry |
| Author(s) |
Nancy L. Michael, Woong-Ho Bang, Choong-Un Kim |
| On-Site Speaker (Planned) |
Nancy L. Michael |
| Abstract Scope |
Porous thin films are used in various applications, including the coating for biomaterials and energy storage materials, as they provide unique electrical, structural and chemical properties that are not available at the bulk. Characterization of pore structure is typically done by a direct observation of pores using microscope, but such techniques only visualize limited volume of the film. The need for new characterization techniques is growing, especially because the use of thin films with extremely small pore size, is expanding. A new technique that can characterize the pore structure without limitations of microscopy is developed in our research. This technique is based on a simple voltammetry that uses ions in electrolyte as pore size tracer and found to work even with nanoscale pores. This paper introduces theoretical background and experimental examples of the technique. |
| Proceedings Inclusion? |
Planned: Other (describe below) |