| About this Abstract |
| Meeting |
Materials Science & Technology 2011
|
| Symposium
|
MS&T'11 Poster Session
|
| Presentation Title |
119 Measuring Heterophase Interface Character Distribution (HICD) in Accumulative Roll-Bonded (ARB) Cu-Nb Multilayered Composites |
| Author(s) |
Sukbin Lee, Jonathan E LeDonne, Samuel CV Lim, Irene J Beyerlein, Anthony D Rollett |
| On-Site Speaker (Planned) |
Sukbin Lee |
| Abstract Scope |
The full five-parameter heterophase interface character distributions (HICD) in accumulative roll-bonded (ARB) alloyed Cu-Nb multilayer composites are presented. The heterophase interfaces between Cu and Nb are segmented on two-dimensional electron back-scatter diffraction (EBSD) maps using the multi-material marching square algorithm. The segmented interfaces are smoothed subject to the constraint of constant area of each initially segmented individual domain. Three-dimensional heterophase interface normal vectors are then derived from the normals to the smoothed interfaces with certain assumptions. The HICD shows a strong preference for {110}Cu and {112}Cu and {112}Nb planes. The interphase misorientations includes Kurdjumov-Sachs and the preferred normals vary with misorientation type. This result is contrasted with the {111}Cu and {110}Nb normals that are characteristic of physical vapor deposited (PVD) pure Cu-Nb multilayers. Support from the BES-supported CMIME and the NSF-supported MRSEC at CMU is acknowledged. |
| Proceedings Inclusion? |
Undecided |