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Meeting 2019 TMS Annual Meeting & Exhibition
Symposium Characterization of Materials through High Resolution Imaging
Presentation Title Learning CDI Reconstructions with Backpropagation
Author(s) Youssef Nashed
On-Site Speaker (Planned) Youssef Nashed
Abstract Scope Synchrotron radiation light source facilities are leading the way to ultrahigh resolution X-ray imaging. High resolution imaging is essential to understanding the fundamental structure and interaction of materials at the smallest length scale possible. Coherent diffraction imaging (CDI) achieves nanoscale imaging by replacing traditional objective lenses by pixelated area detectors and computational image reconstruction. We present our work for solving CDI reconstruction problems through fitting a physics based model to measured data. The model parameters are learned in a similar manner to deep neural networks, utilizing the backpropagation method as implemented in Google TensorFlow package. This approach has advantages in terms of speed and accuracy compared to current state of the art algorithms, and demonstrates re-purposing the deep learning backpropagation algorithm to solve general inverse problems that are prevalent in materials imaging research.
Proceedings Inclusion? Planned: Supplemental Proceedings volume

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

3D Mapping of Subgrains with High Resolution 3DXRD
A Fast Algorithm for Improving Reconstruction Quality with Incomplete Tomography Data
Advances in Fatigue Crack Growth Characterization via In Situ Phase Contrast Tomography Imaging
Coherent Diffraction Imaging at High X-ray Energies
Computational Investigation of Limits of Bragg Coherent Diffraction Imaging
Deep Learning of Inverse Problems in Scanning Transmission Electron Microscopy/Scattering
Deep Neural Networks for Feature Extraction and Image Reconstruction from Coherent X-ray Diffraction Imaging Data
Deformation Behavior of Functionally Graded Polymeric Foams Using X-ray Tomography
Direct Observation of Point to Parallel Array Cu GB Segregation Behavior in Al Alloy 7075
Examining Dzyaloshinskii Domain Walls in Asymmetric Pt/Co/Ni/Ir Superlattices Using Lorentz TEM
Exploring Ion-irradiation Damage Using Bragg Coherent X-ray Imaging and 3D Transmission Electron Microscopy
Hard X-ray Coherent Diffraction Imaging Using Nanoscale Focusing Optics
High Throughput Nano-size Precipitates Characterization of Steels with Unprecedented Statistics: Transmission Kikuchi Diffraction on Extraction Replicas
Identification and Visualization of Chemical Outliers through Scientific Data Mining in Nanoscale Spectro-microscopic Study of NMC Electrode
In Situ Loading of Engineered Materials during X-ray 3D Tomographic Imaging
Investigation of Helium Precipitates in Ta(Ti)/Zr(Ti) Composites Made by Solid Metal Dealloying
K-18: High-resolution Multi-modal Imaging Capability at the Hard X-ray Nanoprobe Beamline of NSLS-II
Learning CDI Reconstructions with Backpropagation
Materials Characterisation via Optical Ptychographic Imaging: Principles and Applications
Measurements of Irradiation Induced 3D Strain Field at the Nanoscale with X-ray Bragg Coherent Diffraction Imaging
Multi-angle Bragg Projection Ptychography with Probe Retrieval
Multi-modal 3D Imaging of LiNi1-x-yMnxCoyO2 Cathode Material with Concentration-gradient
Multi-reflection Bragg Coherent Diffractive Imaging of Real-world Materials Samples
Multimodal Imaging Using Hard X-ray Speckle
Photoelastic Ptychography for Anisotropic Imaging of Optically Transparent Samples
Recent Development of Full-field X-ray Microscope at NSLS-II - A Case of Battery Research
Revealing the Growth Dynamics of Nature’s Forbidden Crystals
Sparse Dictionary Learning Methods for Coherent X-ray Diffractive Imaging
STEM Diffraction Contrast Image Simulations for Complex Dislocation Configurations
Three-dimensional Imaging of Vortex Phases in Ferroic Materials
Ultrahigh-speed X-ray Imaging for Studying Materials Structure Dynamics
Understanding Catalyst Complexity at Synchrotron Light Sources Using Hard X-ray Ptychography and Tomography
X-ray Coherent Surface Scattering Imaging for Surface 3D Imaging and Material Characterization

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