|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation Mechanisms
||Tracking Shear-migration Coupling of Grain Boundaries Using In Situ TEM
||Marc Legros, Nicolas Combe, Frédéric Mompiou
|On-Site Speaker (Planned)
The large proportion of grain boundaries in nanocrystals may compensate the absence of dislocations by influencing the plastic deformation mechanisms. The so-called shear-migration coupling has proved to significantly contribute to plasticity despite being poorly characterized in polycrystals experimentally or theoretically.
We have conducted both in-situ TEM experiments and molecular dynamic simulations using the NEB technique (Nudge Elastic Band) and shown that shear-migration coupling involves the displacement of linear defects called disconnections that are specific to grain boundaries. As dislocations in the crystal, the properties of these disconnections seem to guide the coupling mechanism of migrating grain boundaries. They are also involved in GB sliding and grain rotation.
||Planned: Supplemental Proceedings volume