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Meeting 2018 TMS Annual Meeting & Exhibition
Symposium Surface Interactions in Materials
Presentation Title Measurement of Interfacial Strength between a Thin Film and Substrate by Using Nano Mechanical Raman Spectroscopy (NMRS)
Author(s) Debapriya Pinaki Mohanty, Khalid Hattar, Vikas Tomar
On-Site Speaker (Planned) Debapriya Pinaki Mohanty
Abstract Scope Current work focuses on the measurement of interfacial strength between Cerium alkoxides (Ce(OBP)3) thin film and Zircaloy-4 by using Raman Spectroscopy. In current work, we have performed experiment by using compressive load. When load is applied to the substrate, load transfer to the film takes place through the interface and delamination occurs at a certain critical load. Interface strength is measured in terms of stress distribution along the interface obtained from Raman Spectroscopy. The experimental results of film/ Zircaloy-4 interface is reported by using new system and validated against the traditional interfacial measurement method. In addition, we have also analyzed the change in the properties of thin layer after experiment by using Nano-indentation method. Different sample having thin film cured for different period has been used in our analysis to investigate the effect of curing period on interfacial strength.
Proceedings Inclusion? Planned: Supplemental Proceedings volume


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