|About this Abstract
||Materials Science & Technology 2009
||Characterization and Modeling of Ceramic-Ceramic and Metal-Ceramic Interfaces
||Direct Imaging of Individual Dopant Atoms in Ceramic Grain Boundaries
||Naoya Shibata, Scott D. Findlay, Shinya Azuma, Teruyasu Mizoguchi, Yuichi Ikuhara
|On-Site Speaker (Planned)
High angle annular dark field (HAADF) imaging in scanning transmission electron microscopy (STEM) is well suited to identifying heavy elements in lighter surrounds. This has been used to explore the detailed configuration of impurity atoms segregated at grain boundaries in many ceramic materials, where such dopant addition can significantly changes the physical properties of the material. At best, a single image only gives a clear indication of the projected structure along one direction, but the complexity of interface structure makes it desirable to seek further information, such as individual dopant atom distribution across the interface plane. In this study, we will show our recent results on the rare-earth segregation in alumina grain boundaries using HAADF STEM combined with density functional theory calculations, and also discuss the prospects for 3D imaging of individual dopant atoms in a buried crystalline interface.