|About this Abstract
||Materials Science & Technology 2011
||MS&T'11 Poster Session
||159 Oxide Scale Development in Select Alloys from the Nb-Mo-Cr-Si-B System
||Eduardo Soto, Katherine Thomas, Benedict Portillo, Shailendra K Varma
|On-Site Speaker (Planned)
The development of oxide scales was examined on three alloys from the Nb-Mo-Cr-Si-B system with compositions in atomic percent of Nb-10Mo-25Cr-15Si-5B, Nb-15Mo-25Cr-20Si-5B, and Nb-20Mo-25Cr-15Si-10B. The oxide scales were developed during the ramping of each sample to temperatures between 700 and 1300°C, after which samples were held at temperature for 10 minutes then removed from the furnace. The oxide scales were characterized by various scanning electron microscopy techniques including secondary, back scatter mode, energy dispersive (X-Ray) spectroscopy, and x-ray mapping. Surface oxides were characterized by x-ray diffraction. Results will be presented in the poster.