| About this Abstract |
| Meeting |
2019 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Materials through High Resolution Imaging
|
| Presentation Title |
Measurements of Irradiation Induced 3D Strain Field at the Nanoscale with X-ray Bragg Coherent Diffraction Imaging |
| Author(s) |
Richard L. Sandberg, Mathew J. Cherukara, Reeju Pokharel, Eric N. Hahn, Wonsuk Cha, Ross J. Harder, Saryu J. Fensin |
| On-Site Speaker (Planned) |
Richard L. Sandberg |
| Abstract Scope |
The nucleation and propagation of dislocations is an ubiquitous process that accompanies the plastic deformation of materials. Consequently, following the first visualization of dislocations over 50 years ago with the advent of the first TEMs, significant effort has been invested in tailoring material response through defect engineering and control. To accomplish this more effectively, the ability to identify and characterize defect structure and strain following external stimulus is vital. In this letter, using X-ray Bragg coherent diffraction imaging (BCDI), we describe the first direct 3D X-ray imaging of the strain field surrounding a line defect within a grain of freestanding nanocrystalline material following tensile loading. By integrating the observed 3D structure into an atomistic model, we show that the measured strain field corresponds to a screw dislocation. |
| Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |