|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||In Operando Nano- and Micro-mechanical Characterization of Materials with Special Emphasis on In Situ Techniques
||Direct Imaging of Mechanically or Thermally Induced Grain Structure Changes in Nanocrystalline Metals
||Christian Kuebel, Aaron Kobler, Krishna Kanth, Horst Hahn
|On-Site Speaker (Planned)
Understanding the deformation processes in nanocrystalline metals during mechanical loading as well as during thermal annealing is a crucial step to optimize and develop these materials for practical applications.
We have been developing automated crystal orientation mapping in STEM mode (ACOM-STEM) as a quantitative tool to directly image the grain structure of nanocrystalline metals including their local crystallographic orientation and optimized this approach to follow the structural changes during in-situ heating or straining. The structural evolution is analyzed to identify the active deformation processes and further compared to simulations based on the experimentally observed grain structure. We applied this approach to magnetron sputtered nanocrystalline Au and Pd films both during straining and thermal annealing observing the structural evolution in real space.
||Planned: A print-only volume