|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Measuring Intra-grain Orientation Gradient and Elastic Strain Field by Near-field High Energy X-ray Diffraction Microscopy
||Yu-Feng Shen, R. M. Suter
|On-Site Speaker (Planned)
Near-field High Energy x-ray Diffraction Microscopy (nf-HEDM), a synchrotron-based, non-destructive, 3-D characterization technique, has been used to reliably measure the grain maps of various materials, from elemental metals to complex industrial alloys. Recent research shows that this technique also has the ability to reconstruct the intra-grain orientation gradient and the elastic strain distribution with good resolution, which offers unique opportunities for testing and developing computational models of materials responses.
||Planned: Supplemental Proceedings volume