|About this Abstract
||Materials Science & Technology 2011
||Recent Advances in Structural Characterization of Materials
||100 Hz Synchrotron Hard X-Ray Micro-Tomography
||Wah-Keat Lee, Xianghui Xiao, Kamel Fezzaa
|On-Site Speaker (Planned)
Currently, the fastest 3D micro-tomography measurements take about 1 s using synchrotron radiation. This limits the types of 3D dynamics that can be tracked. The ability to acquire 3D micro-tomography data at faster rates will have a significant impact in many fields. Here, we demonstrate 100 Hz hard-x-ray micro-tomography using the white beam at the 32-ID beamline at the Advanced Photon Source. Although white beam was used, the undulator was set such that the x-ray spectrum peaks at around 10-12 keV. The samples were mounted on the shaft of a motor spinning at about 50 Hz and the projection images were acquired continuously on-the-fly using a high frame rate camera. In order to achieve the high frame rates (45000 images/s), the field of view was limited to 448x256 pixels. The current limitations of the technique are due to camera and sample issues, and not x-ray flux.
||Definite: A CD-only volume