|About this Abstract
||2014 TMS Annual Meeting & Exhibition
||Neutron and X-ray Studies of Advanced Materials VII: Challenges of the Future World
||C68: Anomalous Small-angle Scattering with Soft X-rays at Al and Si K Absorption Edges
||Hiroshi Okuda, Ryo Shirai, Takayoshi Yamamoto, Yuki Nishizawa, Yoshinori Kitajima
|On-Site Speaker (Planned)
Small-angle scattering measurements in soft X-ray region are useful to examine nanostructure of materials that have small contrast or strong hetrogeneity near their surface. Use of anomalous dispersion of relatively light element, such as K absorption edges of Al, Si or P, is exected to be a new tool for examining conventional materials such as Al-Mg-Si alloys, though there are some technical points to improve yet. The measurements were made at beamline 11A and 11B of Photon Factory, Tsukuba Japan. In the present work, preliminary results on the small-angle scattering at K absorption edge of Al are shown for Al alloys and compounds, where contrast change with incident energy was confirmed, and compared with the measurements at the Si edge.
||Planned: Metallurgical and Materials Transactions