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Meeting 2017 TMS Annual Meeting & Exhibition
Symposium Characterization of Materials through High Resolution Coherent Imaging
Presentation Title Anisotropic Growth Patterns in Four Dimensions
Author(s) Ashwin J. Shahani, Xianghui Xiao, Peter Voorhees
On-Site Speaker (Planned) Ashwin J. Shahani
Abstract Scope Four-dimensional X-ray tomography (4D-XRT) has made it possible to follow microstructural evolution in three dimensions and as a function of time. The advent of novel techniques in reconstruction, data processing, visualization, and analysis now opens the door to a class of problems previously unexplored due to the lack of real-time 4D experiments. This is especially true of microstructures that have complex interfacial morphologies, such as group IV semiconductor crystals. For instance, silicon and germanium exhibit “mixed morphologies,” i.e., both faceted and rounded, due to the prevalence of defects that intersect the solid-liquid interfaces. Examples of our 4D-XRT results on the growth forms of such structures, collected in the absorption and phase mode, will be presented and discussed.
Proceedings Inclusion? Planned: Supplemental Proceedings volume


3D Imaging of High-pressure Induced Deformation Twinning in a Nanocrystal
3D X-ray Imaging of Defect Dynamics in Nanostructured Materials
Anisotropic Growth Patterns in Four Dimensions
Applications of High Resolution Coherent X-Ray Imaging Techniques for Investigating Additively Manufactured Materials
Biological and Bio-inspired Multifunctional Structural Materials
Biological Imaging Using Combined Ptychography and X-ray Fluorescence
Biomimetic CaCO3 Complex Morphologies Studied by Coherent X-ray Diffraction Imaging
Characterizing Evolving Processes through Coupled CDI and Molecular Dynamics Studies
Coherent Diffractive Imaging with Wavelength Spatial Resolution using 13.5nm High Harmonics: Full Field, High-contrast Imaging on a Tabletop
Coherent X-ray Diffraction Measurements of Lattice Distortions Caused by Ion Bombardment
Coherent X-ray Imaging at Future High Brightness Synchrotron Sources
High Resolution Coherent Imaging for Materials
High Speed Tomographic Imaging of Materials during Uniaxial Loading
Imaging Strain Fields by Ptychographic Topography
In-Situ and In-Operando Examination of Structure-Functional Relations in Porous Materials for Energy Conversion and Storage with Nano- and Micro- Synchrotron X-ray Computed Tomography
In-situ Deformation and Damage Assessment in Materials under Dynamic Loading Using High Speed Synchrotron X-ray Phase Contrast Imaging
In-situ Phase Contrast Nano-tomography at ID16B
Nanoscale 4D Microstructural Evolution of Precipitates in Aluminum Alloys Using Transmission X-Ray Microscopy (TXM)
Nanoscale Chemical Imaging of an Individual Catalyst Particle with Soft X-ray Ptychography
Phase Contrast Tomography to Document Gypsum Dehydration in Single Crystals and Polycrystalline Materials
Photoelastic Ptychography: A New Approach for Quantitative Stress Determination
Polychromatic Bragg Coherent X-ray Diffraction Imaging for Rapid Measurements
Progress towards Dichroic Bragg Coherent Diffractive Imaging
Real-time Direct and Diffraction Hard X-ray Imaging of Ultra-fast Processes
Revolutions in Coherent X-ray Sources Will Enable Dynamic Nanometer Scale Strain Imaging in Structural Materials
Soft-X-ray Ptychographic Imaging of Shale
Some Recent Advances in the Theory and Modeling of Phase Contrast Imaging
Speckle-based X-ray Imaging at Diamond Light Source
Unraveling the Structure-function Relationships in Ion Implanted Nanodiamonds
Zernike Phase Contrast for Hard X-ray Microscopy

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