| About this Abstract |
| Meeting |
2016 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Revealing Deformation Mechanisms in Superalloys Using STEM-Based Imaging and Spectroscopy |
| Author(s) |
, Tim M Smith, Yunzhi Wang, Stephen R Niezgoda |
| On-Site Speaker (Planned) |
|
| Abstract Scope |
The promise presented by ICME for accelerating the insertion of new materials in high performance structural applications relies upon the fidelity of materials models, including capturing the connectivity between processing, microstructure and performance. This presentation will focus on advancements in our ability to characterize deformation mechanisms at finer length-scales – from atomic to grain-level behavior. In the Ni-base superalloys, a surprising variety of governing mechanisms are observed as a function of microstructure and deformation condition. In particular, at elevated temperature, the strain rate and temperature dependence of deformation depends on the onset of several deformation mechanisms that are quite distinct from the “classic” APB shearing process. Using electron-microscopy-based techniques, new insights into the governing deformation mechanisms in several important structural materials are being developed. The important interplay between characterization and modeling at several length-scales (atomistic, phase field and crystal plasticity) in elucidating rate-limiting processes will also be discussed. |
| Proceedings Inclusion? |
Planned: EPD Congress Volume |