|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||High Entropy Alloys VI
||Screening of Structure and Properties of FCC Thin Film HEAs Using Compositional Gradient Samples
||Azin Akbari, Artashes N. Ter-Isahakyan, T. John Balk
|On-Site Speaker (Planned)
Different combinations of CrMnFeCoNiCu thin film samples were prepared by simultaneous magnetron sputtering of the elements (all 6, or subsets of 5) onto silicon wafer substrates. This arrangement yielded a wide chemical composition gradient in the films, which resulted in formation of different phases. Some of these exhibited the desired single-phase HEA, albeit with non-stoichiometric compositions. In order to screen the structure and properties of these potential alloys, multiple characterization techniques were used. Microstructure and composition of thin film samples were characterized via scanning electron microscopy and energy dispersive x-ray spectroscopy. Single-phase FCC regions were detected in the samples by X-ray diffraction and electron backscattered diffraction analysis. Mechanical and environmental properties of these alloys were screened across the composition range via nanoindentation and corrosion testing, respectively. These results were used as the basis for identifying optimized bulk HEAs for investigation in another study.
||Planned: Supplemental Proceedings volume