|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Recent Advances in Functional Materials for Printed, Flexible and Wearable Electronics
||Nondestructive Examination Study in P(VDF-TrFE) Filter System and PM2.5 Spatial Resolution Technology by Using Synchrotron Transmission X-ray Microscopy
||E-wen Huang, Hui-Tzu Yeh, Chun-Chieh Wang, Wei-Chieh Huang
|On-Site Speaker (Planned)
The aim of this study is to develop a system for P(VDF-TrFE) filters and for the analysis of PM2.5 air pollutant filtration. To understand the filtration mechanism and provide a profound information for P(VDF-TrFE) filters, we perform a study using synchrotron transmission X-ray microscopy (TXM). TXM is a nondestructive instrument, used for observing materials in nano- to sub-micron scale due to its large penetration depth and superior spatial resolution up to 60nm. In this study, we used TXM to identify the ultrastructure of P(VDF-TrFE) filters and the microstructure of airborne particles. The study has successfully used TXM to examine newly developed material structures. The data results provide morphology of NaCl particles captured by P(VDF-TrFE) filters which enable us to understand the filtration mechanism.
||Planned: Supplemental Proceedings volume