|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||3D Dislocation Crystallography
||Zongqiang Feng, Chengwei Lin, Guilin Wu, Xiaoxu Huang
|On-Site Speaker (Planned)
Simultaneous characterization of crystallography and morphology of dislocations is of great importance for full understanding of relationships between dislocation behaviors and various properties of crystalline materials. The advent and development of dislocation tomography over the past decade provides new capability for three-dimensional (3D) characterization of dislocations. However, it is still lack of in-depth analysis of dislocation crystallography from 3D perspective. Moreover, a coupling between morphological and crystallographic information is needed. Combining electron tomography and conventional crystallography analysis of dislocations, we developed a high throughput characterization approach to obtain the 3D crystallographic characteristics of dislocations, such as dislocation character, glide plane, line direction and Burgers vector. This approach has been applied to analyze the dislocation structure in an aluminum alloy and the results will be presented and discussed.
||Planned: Supplemental Proceedings volume