|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Applications of Solidification Fundamentals
||Microstructural Development During Thin Film Solidification: Comparison of Experiments and Simulations
||Theron Rodgers, Amy J. Clarke, John W Gibbs, James C.E. Mertens, Daniel R. Coughlin, Harrison C. Whitt, Joseph T. McKeown, John Roehling, J. Kevin Baldwin, Seth D Imhoff, Damien Tourret, Jonathan D. Madison
|On-Site Speaker (Planned)
In this work, Dynamic Transmission Electron Microscopy (DTEM) was used for in-situ observations of solidification dynamics in metallic alloys. A pulsed laser was used to melt as deposited, 100 nm-thick metallic alloy films and time-resolved imaging captured solid-liquid interfacial dynamics and microstructural evolution at the microsecond time-scale. With a recently developed simulation method based upon a modified Kinetic Monte Carlo approach, predictions of grain microstructure in polycrystalline systems with well-defined solidification fronts are used to simulate solidification phenomena observed in the DTEM experiments. Both spatial and time-resolved comparisons between experiments and simulations of aluminum-silicon alloy films with various compositions will be presented and discussed. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy’s National Nuclear Security Administration under contract DE-AC04-94AL85000.
||Planned: Supplemental Proceedings volume