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Meeting 2012 TMS Annual Meeting & Exhibition
Symposium Neutron and X-Ray Studies of Advanced Materials V: Centennial
Presentation Title Measurement of S(q) as q → 0 in Amorphous Si
Author(s) Gabrielle Long, Ruobing Xie, Steven Weigand, Simon Moss, Sjoerd Roorda, Salvatore Torquato, Paul Steinhardt
On-Site Speaker (Planned) Gabrielle Long
Abstract Scope Amorphous silicon is a continuous random network (CRN) tetrahedrally coordinated glass. Florescu et al. [1] recently conjectured that a tetrahedrally coordinated CRN glass, which also is “hyperuniform” [2], has substantially larger photonic band gaps than CRN glasses that are not. A hyperuniform point pattern is one in which the variance of points scales with surface area rather than with volume, and S(q → 0)=0 the same as in crystalline solids, which are the simplest form of hyperuniformity. It has been suggested that the band gap properties of real amorphous materials is related to their degree of hyperuniformity [1]. Our research looks into the nature of a-Si via a highly sensitive measurement of the long wavelength limit of the structure factor S(q → 0), which can indicate the presence of hyperuniform ordering. [1] M. Florescu, et al., Proc. Nat. Acad. Sci. USA (2010) 20658 [2] S. Torquato, F.H. Stillinger, Phys. Rev. E 68 (2003) 041113
Proceedings Inclusion? Planned: Metallurgical and Materials Transactions


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