|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||A Study of Grain-level Deformation and Residual Stresses in Ti-7Al under Combined Bending and Tension
||Kamalika Chatterjee, Armand Beaudoin, Ajey Venkataraman, Michael Sangid, Tim Garbaciak, John Rotella, Peter Kenesei, Jun-Sang Park
|On-Site Speaker (Planned)
In-situ high energy x-ray diffraction (HEXD) experiments are carried out to analyze the state of combined bending and tension in Ti-7Al alloy under room temperature creep. The experiment was conducted at beamline 1-ID of the Advanced Photon Source. The stress gradient and grain-level residual stresses are successfully determined. A cluster of three neighboring grains are identified that highlight the variation of mean and effective stress between grains. Crystallographic orientations and slip characteristics are analyzed for the selected grains. It is inferred that the interface between loaded grains with markedly different stress triaxiality and slip tendency is vulnerable to crack initiation. Finally, a virtual polycrystal geometry is generated using the experimentally extracted centroid and orientation of the grains. A field dislocation mechanics (Roy et al., 2007) based finite element simulation is carried out to find the grain-level residual stresses. Numerically found residual stresses exhibit good agreement with the experimental results.
||Planned: EPD Congress Volume