|About this Abstract
||Materials Science & Technology 2011
||MS&T'11 Poster Session
||059 Raman Scattering as a Tool to Characterize the Changes of the Silicate Glass Structure after Ion Implantation
||Blanka Svecova, Pavla Nekvindova, Anna Mackova, Petr Malinsky, Vladimir Machovic, Milos Janecek, Josef Pesicka, Jarmila Spirkova
|On-Site Speaker (Planned)
We demonstrate the utility of Raman spectroscopy as a technique for the characterization of changes of the glass structure caused by ion implantation. We studied the differences between various glasses implanted with gold ions and then annealed under the identical conditions. We focused on the depolymerization of the glass structure defined as ratio of Si–O stretching and bending modes and the analysis of the Qn components of the Si–O stretching mode envelope and discussed the relationship between Raman parameters and results obtained by Rutherford Backscattering Spectroscopy and Transmission Electron Microscope analysis. The results indicate depolymerization of the glass network after ion implantation, mainly in the depth of maximal Au concentration. Moreover, we found that the degree of depolymerization depends on the type of glass used and significantly influences nucleation of Au nanoparticles and their parameters and the non-linear optical effect as a consequence. Acknowledgement: GACR106/09/1937, LC06041, MSMT6046137302.