About this Abstract |
Meeting |
MS&T22: Materials Science & Technology
|
Symposium
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Advances in Dielectric Materials and Electronic Devices
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Presentation Title |
Structure and Electrical Properties of Metrically Cubic PMN-PT Thin Films around the Morphotropic Phase Boundary |
Author(s) |
Matjaž Spreitzer, Urška Trstenjak, Nina Daneu, Iegor Rafalovskyi, Jamal Belhadi, Aleksander Matavž, Vid Bobnar, Jiři Hlinka |
On-Site Speaker (Planned) |
Matjaž Spreitzer |
Abstract Scope |
Understanding the relationship between structural characteristics and the functional properties of complex relaxor ferroelectric thin films is of high interest for designing materials with high performances. In this work, the structure of epitaxial relaxed pulsed-laser-deposited Pb(Mg1/3Nb2/3)O3-xPbTiO3 (PMN-xPT; x = 25, 33 and 40) thin films on LaNiO3/SrTiO3 substrates was analyzed using a variety of diffraction and spectroscopic techniques. While, based on the data obtained from high-resolution X-ray diffraction and scanning transmission electron microscopy analysis, the average structure of the PMN-xPT films is metrically cubic, micro-Raman polarimetry measurements indicate the tetragonal-like ferroelectric phase with a marked preference for the polarization perpendicular to the film for all three compositions. The results of the Raman scattering analysis are supported by the electromechanical properties of the samples, which clearly show that the films have a locally non-centrosymmetric structure. |