|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Thermal and Mechanical Stability of Nanocrystalline Materials
||Investigating the Thermal Stability of FCC and BCC Nanocrystalline Thin Films by In Situ TEM Annealing and Post Mortem TKD Analysis
||Josh Kacher, Jordan Key
|On-Site Speaker (Planned)
Nanostructured metal thin films have been shown to have unique thermal, mechanical, and electrical properties when the internal structure can be maintained. However, this far-from-equilibrium structure has been shown in many cases to be unstable at relatively low homologous temperatures. This work investigates the primary mechanisms dictating grain growth in nanocrystalline Ni and Fe thin films using in situ transmission electron microscopy (TEM) annealing experiments followed by transmission Kikuchi diffraction (TKD) analysis of the grain structure. It will be shown that the grain growth process is driven by energy reduction, with surface energies and grain boundaries often playing competing roles. By altering the deposition conditions, the initial texture of the thin films can be altered, significantly affecting the thermal stability and grain growth behavior.
||Planned: Supplemental Proceedings volume