|About this Abstract
||Materials Science & Technology 2011
||Recent Advances in Structural Characterization of Materials
||3D EBSD-FIB Characterization of Cold Roll Bonding Ti-Al-Nb Multilayer Sheets
||Peng Qu, Hui Xu, Liming Zhou, Viola L. Acoff
|On-Site Speaker (Planned)
Multilayered Ti-Al-Nb sheet was produced successfully by accumulative cold roll bonding (ARB) technology from pure Ti, Al and Nb elemental foils. The texture and microstructure change of the element foils during ARB was not very clear and was investigated by a few other researchers. Our previous research showed some texture evolution after ARB on the cross section of the sheets via two dimensional EBSD (electron backscattered diffraction). Currently the three dimensional EBSD-FIB (focused ion beam) has proven to be a powerful method for understanding the deformation of materials. To date, no reports have been published utilizing this tool to characterize multilayer ARB sheets. In this study, multilayered Ti-Al-Nb sheets with different ARB cycles were subjected to serial sectioning using ion beam milling. These slices were mapped consecutively by EBSD. Detailed 3D crystallographic maps were reconstructed and analyzed. The results were compared to the 2D maps.
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