|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Fracture Properties and Residual Stresses in Small Dimensions
||Liquid Metal Embrittlement at the Micro-scale: Gallium FIB vs. Xenon FIB
||Yuan Xiao, Jeff Wheeler
|On-Site Speaker (Planned)
Micromechanical testing of structures fabricated using focused ion beam (FIB) has allowed significant progress to be made in understand the deformation and properties of small volumes of materials. However, the vast majority of FIB structures are machined using Gallium, which is known to embrittle many metals (e.g. Al, Cu and Fe) by weakening their grain boundaries. This has recently been shown to have a significant negative effect on the strength of micropillars of polycrystalline aluminum. Here we extend upon that work to investigate the effect of Ga FIB on the deformation and fracture properties of grain boundaries of several materials by comparing structures made using both Xe FIB and Ga FIB.