|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Coupling Experiments and Modeling to Understand Plasticity and Failure
||Understanding Shear Band Formation Using High-resolution X-ray Diffraction and Numerical Modeling
||Darren Pagan, Armand Beaudoin, Matthew Miller
|On-Site Speaker (Planned)
There exists a general consensus that localization of deformation at the crystal scale leads to life-limiting processes like crack initiation. A limitation to understating this process has been the lack of mechanistically-based localization data. In this presentation, high-resolution X-ray diffraction is used along with a kinematic model of slip to identify underlying slip activity in-situ during shear band formation within a copper single crystal specimen. The diffraction results indicate that, as expected, the primary active slip system during plastic deformation was that predicted by Schmid’s Law. However, simultaneous DIC measurements show that the shear banding does not have a one-to one relationship with the primary active slip system, suggesting that boundary conditions and the current stress distribution strongly influence the features of shear bands. In addition, a further study exploring the stress fields generated by explicitly modeled geometrically necessary dislocation arrangements consistent with shear band formation will also be presented.
||Planned: Supplemental Proceedings volume