| About this Abstract |
| Meeting |
2016 TMS Annual Meeting & Exhibition
|
| Symposium
|
2016 Technical Division Young Professional Poster Competition
|
| Presentation Title |
YP-7: Novel Conductive Scanning Probe Microscopy (SPM) Probes with Reduced Capacitive Coupling |
| Author(s) |
Yigezu Mulugeta Birhane, Joan Bausells, Jordi Otero, Gabriel Gomila |
| On-Site Speaker (Planned) |
Yigezu Mulugeta Birhane |
| Abstract Scope |
We have fabricated novel insulated conductive scanning probe microscopy probes on silicon on insulator substrates as cantilevers with sharp tetrahedral tips at their free end. We employed various standard microfabrication techniques to batch fabricate the probes, which have significant comparative advantage in terms of cost to that of the already reported serial processing technologies towards the fabrication of insulated conductive SPM probes. The electrical behavior of the batch fabricated probes was tested by custom made capacitance measurement set up that measure the capacitive coupling between the probes and highly ordered pyrolytic graphite (HOPG) substrate. We observed excellent agreement between experiment and theoretical model (which accounts contributions from only the probe tip – sample interactions) in a long range tip – sample distances (beyond 350 nm), that makes our probes an ideal candidate for electrical characterization of small signal samples in liquid media such as biological samples in their physiological environment. |
| Proceedings Inclusion? |
Definite: None Selected |