About this Abstract |
Meeting |
2022 TMS Annual Meeting & Exhibition
|
Symposium
|
Characterization of Minerals, Metals and Materials 2022
|
Presentation Title |
Automated Laue Pattern Analysis for Multi-peak Strain Imaging of Nanocrystals at 34-ID-C |
Author(s) |
Yueheng Zhang, Anthony Rollett, Robert Suter |
On-Site Speaker (Planned) |
Yueheng Zhang |
Abstract Scope |
The 34-ID-C beamline of the Advanced Photon Source has recently acquired the capability to conduct Laue diffraction for indexing arbitrarily oriented crystals, thus, facilitating the collection of coherent diffraction imaging data from multiple Bragg reflections and reconstructing the six-component Eulerian strain tensor inside the volume of a nanocrystal. A polychromatic x-ray beam illuminates a nanocrystal causing multiple reflections to simultaneously fulfill the Bragg condition and casting a unique Laue pattern. When many grains are simultaneously illuminated, multiple Laue patterns appear on the detector, complicating the process of identifying the corresponding set of peaks and indexing. Here, we established workflows that will be available to every beamline user for automating the analysis of overlapping Laue patterns and building an orientation map of the microstructure. Such tools will provide reliable indexing of grains of polycrystalline materials and allow us to intelligently conduct coherent x-ray diffraction experiments on embedded grains. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Modeling and Simulation, Computational Materials Science & Engineering |