|About this Abstract
||2019 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Imaging
||X-ray Coherent Surface Scattering Imaging for Surface 3D Imaging and Material Characterization
||Miaoqi Chu, Zhang Jiang, Tao Sun, Jin Wang
|On-Site Speaker (Planned)
Imaging techniques provide ideal tools to directly observe surface/interface structures and monitor their dynamic evaluation responding to changes in external conditions. Coherent surface scattering imaging (CSSI) is a novel high-resolution non-destructive X-ray imaging technique that is able to image nanostructures at surfaces or buried interfaces. Complement to conventional coherent diffraction imaging (CDI) methods in transmission and Bragg geometry, CSSI can probe non-periodic nano-features in true 3D systems, such as the growth of thin films and quantum dots, dendrites developing in lithium batteries etc. In a typical CSSI experiment, the surface scattering patterns are collected using coherent x-rays in a reflection geometry, thus it has no requirement of sample thickness. Phase retrieval algorithms that incorporate dynamic scattering effects are applied to reconstruct 3D structures. Benefiting from the future Upgraded APS that significantly boosts the coherent X-ray flux, CSSI is expected to become an effective tool for surface science and engineering community.
||Planned: Supplemental Proceedings volume