|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Algorithm Development in Materials Science and Engineering
||Structural Characterizations of Fine Nb Wires in Superconducting Integrated Circuits
||Vivian Ryan, Eric J. Jones, Kevin Mercurio, Nathan P. Siwak, Thomas J. Knight, Sean McLaughlin
|On-Site Speaker (Planned)
To increase functionality, denser features require overcoming the bottleneck of large wire size in current superconducting electronics fabrication schemes. As the wires shrink below 0.5 um, the grain size distribution of the superconducting metal, typically sputtered Nb, becomes increasingly important to provide sound miniaturizing engineering methods. Much of the current understanding of Nb grain structure comes from analysis of bulk samples or small grain populations in quasi-2D structures. Such analysis provides little insight into grain evolution in the mesoscopic dimensions in SC circuits.
We use STEM and other techniques to extensively analyze grain size, shape, and texture in Nb patterns on substrates. The grain characteristics are understood in terms of spatial statistics that reveal unique growth algorithms at mesoscopic dimensions, likely indicating competing growth mechanisms. The implications of these results will be discussed with respect to future scaling.
||Planned: Supplemental Proceedings volume