About this Abstract |
Meeting |
2020 TMS Annual Meeting & Exhibition
|
Symposium
|
Fatigue in Materials: Fundamentals, Multiscale Characterizations and Computational Modeling
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Presentation Title |
Characterization of Fatigue Mechanisms in Nickel Microbeams |
Author(s) |
Alejandro Barrios, Ebiakpo Kakandar, Xavier Maeder, Gustavo Castelluccio, Olivier Pierron |
On-Site Speaker (Planned) |
Alejandro Barrios |
Abstract Scope |
This work presents two small-scale fatigue testing techniques to characterize the nanoscale crack nucleation and propagation mechanisms in electroplated Ni microbeams under bending. The microbeams were subjected to in-situ SEM high cycle and low cycle fatigue loading conditions. In the high cycle regime, crack nucleation and propagation are caused by the formation of voids that likely nucleate from the condensation of vacancies. However, in the low cycle regime, the crack propagation follows the conventional mechanisms of crack tip stress intensification.
To gain further insight into the transition between these fatigue regimes, a 3D microstructural characterization of the fatigued microbeam is obtained by performing electron backscatter diffraction (EBSD) tomographies with Focused Ion Beam (FIB). In addition, finite element modeling with 3D crystal plasticity are coupled with experimental results to provide further understanding of the influence of the microstructure in the fatigue mechanisms. |
Proceedings Inclusion? |
Planned: Supplemental Proceedings volume |