|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Phase Stability, Phase Transformations, and Reactive Phase Formation in Electronic Materials XVI
||Sulfurization Effect on the Ag and Ag-Pd Reflectors
||Erh-Ju Lin, Yan-Hao Chen, Cheng-Yi Liu
|On-Site Speaker (Planned)
In this study, we found that the Ag reflector would be seriously tarnished by the sulfurization, and the reflectivity of the sulfurized Ag reflector drops significantly over 52%. However, if the Pd is alloyed into the Ag layer and forms a Ag-Pd alloy reflector, and the minimum reduction rate (around 20%) occurs at the Ag-Pd reflector with a Pd content of 3.72 at.%. Above, two effects of Pd alloying atoms on the sulfurization of the surface Ag atoms have been drawn, which are (1) chemical-state change effect and (2) surface microstructure effect. We found the chemical-state change effect retards the sulfurization of the surface Ag atoms, but the surface microstructure effect promotes the sulfurization of the surface Ag atoms. Here, we believe that these two opposite effects explain that there is an optimal Pd content on the Ag-Pd surface for the resistance of the sulfurization on the Ag surface.
||Planned: Supplemental Proceedings volume