|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Characterization of Materials through High Resolution Coherent Imaging
||Coherent Diffractive Imaging with Wavelength Spatial Resolution using 13.5nm High Harmonics: Full Field, High-contrast Imaging on a Tabletop
||Dennis Gardner, Michael Tanksalvala, Elisabeth R Shanblatt, Xiaoshi Zhang, Benjamin R Galloway, Christina Porter, Robert Karl, Charles Bevis, Margaret Murnane, Henry Kaptyen, Daniel E Adams, Giulia F Mancini
|On-Site Speaker (Planned)
Ptychography is a powerful coherent diffractive imaging (CDI) technique that relies on many diffraction measurements from overlapping areas of the sample. This approach introduces redundant information, and allows the ptychography algorithms to solve for both the object and illumination. In this talk, we introduce a novel constraint to the ptychography algorithm, termed Modulus Enforced Probe (MEP), which is based on the measurement of the un-diffracted illumination on the detector. We describe how the MEP constraint is employed within the ptychographic algorithm and show the improved convergence of the algorithm. We demonstrate the power of this additional probe constraint by demonstrating record 14nm spatial resolution imaging at a wavelength of 13.5nm for any light source. This experimental demonstration is the best wavelength-to-resolution ratio for any full-field, non-isolated sample, CDI-based microscope and in our case we achieve this using a tabletop-scale setup.
||Planned: Supplemental Proceedings volume