|About this Abstract
||Materials Science & Technology 2012
||Advances in Dielectric Materials and Electronic Devices
||Fractal Microstructure and Dielectric Characteristics of Dopped Batio3 Ceramics
||Vojislav V Mitic, Vesna V Paunovic, Ljubisa Kocic, Slobodanka Jankovic, Vladimir Pavlovic
|On-Site Speaker (Planned)
||Vojislav V Mitic
In this study new approach on correlation between microstructure and properties of doped BaTiO3 -ceramics based on fractal geometry has been developed. BaTiO3 ceramics doped with rare-earth additive were prepared using conventional solid state procedure.The microstructure was investigated by SEM-5300 and capacitance have been done using LCR-meter Agilent 4284A. By using method of fractal modeling a of microstructure configurations reconstruction, like shapes of grains or intergranular contacts has been successfully done. Furthermore, the area of grains surface was calculated using fractal correction that expresses the irregularity of grains surface through fractal dimension. For better and deeper characterization of the ceramics material microstructure the Voronoi model and mathematical statistics calculations, are applied The presented results indicate that fractal method for analysis of the structure of ceramics provides a new approach for describing, predicting and modeling the grain shape and relations between the BaTiO3 ceramic structure and dielectrical properties.