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Meeting 2016 TMS Annual Meeting & Exhibition
Symposium Phase Stability, Phase Transformations, and Reactive Phase Formation in Electronic Materials XV
Presentation Title Stress and Currents Density Effects on Copper-Tin Intermetallic Compound Formation
Author(s) Yue-Lin Lee, Jhou-Cheng Wu, S.-F. Lin, Ming-Tzer Lin
On-Site Speaker (Planned) Ming-Tzer Lin
Abstract Scope Cu-Sn intermetallic compound (IMC) is the most common and important IMC formed between Sn-based solders and Cu substrates during soldering. The current density and stress on the Cu-Sn IMC could have significantly effects on the electromigration but very little was known. Here, a bulge test was performed to investigate the influence of the current density and external stress on the growth of Cu-Sn intermetallic compound. The bulge height was to maintain the stress of the specimens simultaneously having electrical current passing through it. Samples were tested under different tensile stress as well as under different tensile stress and current density (10^4 A/cm^2) with respect to the annealing temperature of 100℃ and 200℃. The results show significantly electromigration effects with the external tensile stress and current density. The effects of stress and current density were presented and discussed.
Proceedings Inclusion? Planned: A print-only volume


A New Insight on the Electromigration Effect: Strain-induced Atomic Migration under Current Stressing
A Significant Improvement in the Electrocatalytic Stability of N-doped Graphene Nanosheets used as a Counter Electrode for Iodide/triiodide based Dye-sensitized solar cells and [Co(bpy)3]3+/2+ based Porphyrin-sensitized Solar Cells
Ab Initio Mechanistic Study on the Charging/Discharging Behaviors of the Layered-layered Lithium-rich Composite Cathode for Lithium-ion Batteries
An Experimental and Computational Approach to Properties of Mg2TiO4: Mn+4 Red Emitting Phosphor
Analysis for Formation of Kirkendall Voids during Solid-state Annealing in the Cu/Sn System
Calorimetric Investigation of the Liquid Sn-3.8Ag-0.7Cu Alloy with Minor Co Additions
Comparison of Electrotroless and Electroplating of Nickel Iron Alloy for the Diffusion Barrier of UBM
Contact-Resistance Reduction for Cu(Ti)/Conductive-Oxide-Film Junctions
Creep-induced Voiding in Sn phase of Pb-free Solder Joint
Development of High Strength and High Electrical Conductivity of Cu-Ni-Al Alloys
Dissolution Behavior of Ni Substrate and Ni3Sn4 Phase in Molten Lead-free Solders
Effect of Cu Surface Microstructure on Surface Oxidation and Soldering Wettability
Effects of Electroless Copper Bath Compositions on the Adhesion of Cu/Substrates in PCB
Effects of Electroplating Formula on the Void Formation at the Sn/Electroplated Cu Interface
Effects of Electromigration on the p-Bi2Te3/Sn Interfacial Reactions
Electrochemical Evaluation of Copper Etchant to Reduce the Galvanic Etching in Cu/Au Coupled Pads
Failure Mechanism of Cu6Sn5 Microbumps under Current Stressing
Formula Optimization of Titanium Dioxide Paste for Dye-sensitized Solar Cells
Interfacial Reactions between Tin and Ni-coated Bi2Te3
Interfacial Reactions in the Ni/Ag-Sb and Ni/Ag-Ge Couples
Investigation on the Phase Stability of Perovskite in La-Sr-Cr-Fe-O System and Its Long-term Operation
Kinetic Study of Silver Electrocrystallization on Silane-grafted Flexible Indium-oxide Substrate
Kinetics of Low-temperature Copper-Germanide Formation for Applications on Flexible Substrates
Liquidus projection and thermoelectric property of (Cu,Ag)–Ga–Te Thermoelectric Materials
Low-temperature Pressure-less Silver-to-silver Direct Bonding at Ambient Condition: Part I-Experimental Study
Low-temperature Pressure-less Silver-to-silver Direct Bonding at Ambient Condition: Part II-Mechanistic Study
Low Temperature Au to Au Direct Bonding by Highly <110>-oriented Au Films
Low Temperature Copper to Copper Direct Bonding with Different Thickness of (111) Nanotwinned Cu
Material Issues in Memristive Devices
Morphological Stability of Interfaces under Electromigration Condition: Insights from Phase-field Study
Phase Equilibria of the Sn-Fe-Ni Ternary System at 270oC
Phase Equilibria of Thermoelectric Ag-Bi-Se System
Probing Phase Transformations at the Nanoscales – Synchrotron X-ray Microdiffraction for Advanced Applications in Microelectronics, Phase-Change Memory and Solar PV Devices
Rapid Formation and Phase Transformation of Intermetallic Compounds Interconnection under Stress Current at Ambient Temperature
Stress and Currents Density Effects on Copper-Tin Intermetallic Compound Formation
Strong Inhibition of IMC Growth at the Sn/Co System by Minor Ga Addition
The Development of Alumina Nanofluid-based Electrolyte for Thermogalvanic Cells
The Kinetic Analysis of Co-Sn Binary System
Thermal Stabilities and Properties of AgBiS2 and AgBi3S5: a Review and Experimental Study
Tunable Surface Wettability and Adhesivity of Nitrogen-doped Graphene Foam
Using Sn-Bi Solder as the LED Die-attach Material by Controlling the Sn-Bi Composition and the Roughness of the Substrate

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