|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Accelerated Materials Evaluation for Nuclear Application Utilizing Test Reactors, Ion Beam Facilities and Integrated Modeling
||Direct Observation of Radiation Response in Ni and Ni-base Concentrated Solid-solution Alloys
||Chenyang Lu, Ke Jin, Laurent Karim Béland, Taini Yang, Feifei Zhang, Yanwen Zhang, Honbin Bei, Roger E Stoller, Lumin Wang
|On-Site Speaker (Planned)
In this study, pure Ni, single-phase concentrated solid solution alloys (SP-CSAs) NiCo, NiFe and NiCoFeCr have been employed for studying defect dynamics by introducing energetic ions. The target materials have been irradiated to various fluences at both room temperature and high temperature. Cross-sectional transmission electron microscopy (TEM) characterization and Rutherford backscattering spectrometry channeling (RBS-C) spectra have been conducted to study the defect distribution and migration along the cross-section of the samples. High-resolution TEM imaging has been used to characterize the nature of defects. Synergistic computer simulations based on molecular dynamic (MD) and kinetic activation relaxation technique (k-ART) methods were also performed, showing a good consistency with our TEM and RBS observations. The preliminary results show that tuning chemical complexity could effectively affect defect dynamics, which shed a new light on designing radiation tolerant materials.
||Planned: A print-only volume