About this Abstract |
Meeting |
MS&T22: Materials Science & Technology
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Symposium
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Grain Boundaries, Interfaces, and Surfaces: Fundamental Structure-Property-Performance Relationships
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Presentation Title |
Grain Growth Study of Strontium Titanate: Comparison between High Energy X-ray Diffraction Microscopy and Simulation |
Author(s) |
Vivekanand Muralikrishnan, He Liu, Lin Yang, Robert Suter, Michael Tonks, Gregory Rohrer, Amanda R Krause |
On-Site Speaker (Planned) |
Vivekanand Muralikrishnan |
Abstract Scope |
Understanding how individual grain boundaries (GBs) migrate during grain growth is essential for microstructural design and, thus, improved performance. However, the mechanisms of GB migration in a polycrystal are still unclear. Non-destructive 3D X-ray diffraction microscopy provides an opportunity to observe individual GB evolution when subjected to annealing and hence correlate GB migration in a polycrystalline material to local microstructural features. Here, non-destructive high energy diffraction microscopy (HEDM) measurements of strontium titanate (SrTiO3) will be used to investigate the classical relationship between GB velocity and curvature in a polycrystal. The experimentally observed growth behavior will be compared to that in isotropic grain growth simulations to identify how GB character or energy relate to GB motion. The results from this study will provide insights into how simulations can be improved to better predict microstructural evolution. |