|About this Abstract
||2018 TMS Annual Meeting & Exhibition
||Advanced Characterization Techniques for Quantifying and Modeling Deformation
||Microstructural Evolution of Ti-7Al Under Cyclic Loading
||Rachel Lim, Yufeng Shen, He Liu, Robert Suter, Anthony Rollett
|On-Site Speaker (Planned)
High-energy x-ray diffraction microscopy (HEDM), a synchrotron-based, non-destructive, 3-D characterization technique, was used to track microstructural evolution in a sample of α-phase Ti-7Al under cyclic tensile loading over the first 200 cycles. Near-field HEDM measures orientation on a 3-D grid which provides grain morphology, while far-field HEDM measures the strain state of each individual grain. Combined with digital image correlation (DIC) and synchrotron-based x-ray micro-tomography (μ-SXCT), we perform grain-by-grain analysis to track strain evolution under cyclic loading. The results show a decrease in residual elastic strain over the first cycle followed by an increasing build-up of strain. This is being used to develop the model for the first several cycles using the Micromechanical Analysis of Stress-Strain Inhomogeneities with Fourier transforms (MASSIF).
||Planned: Supplemental Proceedings volume