|About this Abstract
||2017 TMS Annual Meeting & Exhibition
||Fracture Properties and Residual Stresses in Small Dimensions
||Studying Plasticity during Fracture at the Micron Scale by Means of Cantilever Experiments in Single-crystalline NiAl and W – HR-EBSD Analyses and Elevated Temperature Measurements
||Johannes Ast, Juri Wehrs, Johann Michler, Xavier Maeder
|On-Site Speaker (Planned)
In order to understand the elastic-plastic fracture process at the microscale in the temperature range from room temperature up to 400 °C, we perform micro-cantilever experiments inside a scanning electron microscope. The materials we focus on, single-crystalline B2-NiAl and tungsten, have brittle to ductile transition temperatures in the investigated temperature range. In that way the fracture behavior and the fracture toughness can be studied in dependence of temperature. Additionally in-situ high resolution electron backscatter diffraction measurements of the area around the crack tip are performed at various loading states at room temperature. This enables the observation of stresses leading to crack growth in the samples. By analyzing the relative misorientations in the crystal, the plastic deformation in terms of geometrically necessary dislocations can be mapped, quantified and used to describe the effect of dislocations on the fracture behavior.