|About this Abstract
||2016 TMS Annual Meeting & Exhibition
||Phase Transformations and Microstructural Evolution
||Determine Crystallographic Orientation Relationship and Orientation of Planar and Linear Features by Electron Microscopy
||Qingfeng Xing, Thomas A Lograsso
|On-Site Speaker (Planned)
Crystallographic orientation relationship determination (CORD) of two phases is critical to understand natures of phase transformation and phase separation. Transmission electron microscopy (TEM) has been used in CORD for more than a half century. Electron backscattered diffraction (EBSD) can determine the orientation of a crystalline grain or phase relative to the sample geometry and may also be used for CORD. EBSD sample preparation and examination are more rapid as compared to TEM but the function is currently unavailable in commercial EBSD software. With a combination of EBSD and focused ion beam (FIB) 3D tomography, the orientations of planar and linear features can be determined by trace analysis. This talk will review the basics of CORD by TEM, present an EBSD-based CORD method, and demonstrate the trace analysis procedures with a two-phase material.
||Planned: A print-only volume